Coherent nonlinear microscopy system and method with variation of the focal volume in order to probe the nanostructure of organized materials (extension du dépôt français EP20090769543) - École polytechnique Access content directly
Patents Year : 2009

Coherent nonlinear microscopy system and method with variation of the focal volume in order to probe the nanostructure of organized materials (extension du dépôt français EP20090769543)

Abstract

A method for the dimensional characterization of a structured material, in which method: an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of the structured material are deduced therefrom.
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Dates and versions

hal-01082167 , version 1 (12-11-2014)

Identifiers

  • HAL Id : hal-01082167 , version 1

Cite

Emmanuel Beaurepaire, Nicolas Olivier, Delphine Débarre, Marie-Claire Schanne-Klein, Jean-Louis Martin. Coherent nonlinear microscopy system and method with variation of the focal volume in order to probe the nanostructure of organized materials (extension du dépôt français EP20090769543). United States, Patent n° : FR20080054347 ; WO2009FR51236 ; US200913001258 ; PCT/FR2009/051236. 2009. ⟨hal-01082167⟩
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