Recent developments in X-UV optics and X-UV diagnostics
Philippe Zeitoun
(1)
,
Philippe Balcou
(2)
,
Samuel Bucourt
(3)
,
Franck Delmotte
(4)
,
Guillaume Dovillaire
(3)
,
D. Douillet
(2)
,
J. Dunn
(5)
,
Gabriel Faivre
(1)
,
M. Fajardo
(1)
,
K.A. Goldberg
(6)
,
S. Hubert
(1, 2)
,
J. R. Hunter
(5)
,
Mourad Idir
(1)
,
Sylvie Jacquemot
(7)
,
S. Kazamias
(2)
,
S. Le Pape
(1)
,
Xavier Levecq
(3)
,
C.L.S. Lewis
(8)
,
R. Marmoret
(7)
,
P. Mercere
(1)
,
Anne-Sophie Morlens
(1)
,
P. P. Naulleau
(6)
,
Marie-Françoise Ravet
(4)
,
C. Remond
(7)
,
J. J. Rocca
(9)
,
R.F. Smith
(5)
,
P. Troussel
(7)
,
C. Valentin
(2)
,
L. Vanbostal
(1)
1
LIXAM -
Laboratoire d'interaction du rayonnement X avec la matière
2 LOA - Laboratoire d'optique appliquée
3 Imagine Optic
4 Laboratoire Charles Fabry de l'Institut d'Optique / Scop
5 LLNL - Lawrence Livermore National Laboratory
6 Center for X-ray Optics
7 DAM/DIF - DAM Île-de-France
8 School of Mathematics and Physics
9 NSF ERC For Extreme Ultraviolet Science and Technology and Department of Electrical and Computer Engineering
2 LOA - Laboratoire d'optique appliquée
3 Imagine Optic
4 Laboratoire Charles Fabry de l'Institut d'Optique / Scop
5 LLNL - Lawrence Livermore National Laboratory
6 Center for X-ray Optics
7 DAM/DIF - DAM Île-de-France
8 School of Mathematics and Physics
9 NSF ERC For Extreme Ultraviolet Science and Technology and Department of Electrical and Computer Engineering
Philippe Zeitoun
- Fonction : Auteur
- PersonId : 4358
- IdHAL : philippe-zeitoun
- IdRef : 08195574X
Philippe Balcou
- Fonction : Auteur
- PersonId : 178208
- IdHAL : philippe-balcou
- ORCID : 0000-0002-5546-6436
- IdRef : 131836196
Franck Delmotte
- Fonction : Auteur
- PersonId : 913971
- IdHAL : franck-delmotte
- ORCID : 0000-0002-6769-6204
D. Douillet
- Fonction : Auteur
- PersonId : 4938
- IdHAL : denis-douillet
- IdRef : 03118703X
Gabriel Faivre
- Fonction : Auteur
- PersonId : 837546
Sylvie Jacquemot
- Fonction : Auteur
- PersonId : 178160
- IdHAL : sylvie-jacquemot
- ORCID : 0000-0001-8342-4172
- IdRef : 167554727
C. Valentin
- Fonction : Auteur
- PersonId : 749586
- IdHAL : constance-valentin
- ORCID : 0000-0001-7519-3829
- IdRef : 197903657
Résumé
Metrology of XUV beams (X-ray lasers, high-harmonic generation and VUV free-electron lasers) is of crucial importance for the development of applications. We have thus developed several new optical systems enabling us to measure the optical properties of XUV beams. By use of a Michelson interferometer working as a Fourier-transform spectrometer, the line shapes of different X-ray lasers have been measured with a very high accuracy (Δλ/λ~10^-6). Achievement of the first XUV wavefront sensor has enabled us to measure the beam quality of laser-pumped as well as discharge-pumped X-ray lasers. A capillary discharge X-ray laser has demonstrated a very good wavefront allowing us to achieve an intensity as high as 3×10^14 W cm^-2 by focusing with a f=5 cm mirror. The sensor accuracy has been measured using a calibrated spherical wave generated by diffraction. The accuracy has been estimated to be as good as λ/120 at 13 nm. Commercial developments are underway. At Laboratoire drsquoOptique Appliquée, we are setting up a new beamline based on high-harmonic generation in order to start the femtosecond, coherent XUV optic .