Mid-infrared electric field characterization using a visible charge-coupled-device-based spectrometer - École polytechnique
Article Dans Une Revue Optics Letters Année : 2005

Mid-infrared electric field characterization using a visible charge-coupled-device-based spectrometer

Résumé

We characterize ultrashort mid-infrared pulses through upconversion by using the stretched pulses obtained from the uncompressed output of a chirped-pulse amplifier. The power spectrum thus translated into the visible region can be readily measured with a standard silicon CCD camera-based spectrometer. The spectral phase is also characterized by a variant of zero-added-phase spectral phase interferometry for direct electric field reconstruction. This is a general method that provides a multiplex advantage over conventional infrared detector array-based methods. © 2005 Optical Society of America
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Dates et versions

hal-00829235 , version 1 (05-05-2014)

Identifiants

Citer

Kevin J. Kubarych, Manuel Joffre, Amy Moore, Nadia Belabas, David Jonas. Mid-infrared electric field characterization using a visible charge-coupled-device-based spectrometer. Optics Letters, 2005, 30 (10), pp.1228-1230. ⟨10.1364/OL.30.001228⟩. ⟨hal-00829235⟩
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