Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias - École polytechnique Access content directly
Journal Articles Solar Energy Materials and Solar Cells Year : 2017

Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

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hal-01640075 , version 1 (20-11-2017)

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Paul Narchi, Vladimir Neplokh, Valerio Piazza, Twan Bearda, Fabien Bayle, et al.. Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias. Solar Energy Materials and Solar Cells, 2017, 161, pp.263 - 269. ⟨10.1016/j.solmat.2016.12.009⟩. ⟨hal-01640075⟩
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